{"id":5019,"date":"2026-01-27T08:09:18","date_gmt":"2026-01-26T23:09:18","guid":{"rendered":"https:\/\/agus.co.jp\/en\/?p=5019"},"modified":"2026-02-10T05:02:56","modified_gmt":"2026-02-09T20:02:56","slug":"what-is-afm-atomic-force-microscopy-a-simple-explanation-of-how-it-works-and-its-features-and-history","status":"publish","type":"post","link":"https:\/\/agus.co.jp\/en\/?p=5019","title":{"rendered":"What is AFM (Atomic Force Microscopy)? A simple explanation of how it works and its features and history!"},"content":{"rendered":"\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"1024\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-1024x1024.jpg\" alt=\"\" class=\"wp-image-5020\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-1024x1024.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-300x300.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-150x150.jpg 150w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-768x768.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic-1536x1536.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM).<\/p>\n\n\n\n<p>If you would like to know more about SPM, please read the following article, which also explains it.<\/p>\n\n\n<div class=\"related_link\"><span class=\"title\"><i class=\"fa-solid fa-bookmark\"><\/i>Related articles.<\/span><ul><li><a href=\"https:\/\/agus.co.jp\/en\/?p=5038\"><span class=\"thumbnail\"><img decoding=\"async\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/pic1-3.jpg\"><\/span><span class=\"post_title\">What is a scanning probe microscope (SPM)? An explanation of types, uses in society and history<\/span><\/a><\/li><\/ul><\/div>\n\n\n\n<p>This article provides an easy-to-understand explanation of how microscopy using atomic forces works to observe a sample.<\/p>\n\n\n\n<p>We hope that you will find this information useful, as we can only provide it because we are usually involved in work related to atoms.<\/p>\n\n\n\n<p>Let&#8217;s look at it.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">AFM (Atomic Force Microscopy) is a microscope that uses atomic force.<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"576\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2-1024x576.jpg\" alt=\"\" class=\"wp-image-5021\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2-1024x576.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2-300x169.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2-768x432.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2-1536x864.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic2.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>AFM is a microscope that uses atomic forces to observe surface topography.<\/p>\n\n\n\n<p>This microscope is most often utilised in SPM, as it allows high-resolution observation of samples in air and without treatment.<\/p>\n\n\n\n<p>One of its strengths is that, unlike <a href=\"https:\/\/agus.co.jp\/en\/?p=5053\">STM (scanning tunneling microscopy)<\/a>, it can measure conductors, semiconductors and insulators without distinction.<\/p>\n\n\n\n<p>The disadvantage is that a normal AFM couldn\u2019t make videos because it would take several minutes to create a single image.<\/p>\n\n\n\n<p>However, it\u2019s now possible to make movies after the recent creation of \u2018high-speed AFM\u2019.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Structure of AFM (Atomic Force Microscopy).<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"576\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/Photo-diodes-1024x576.png\" alt=\"\" class=\"wp-image-5023\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/Photo-diodes-1024x576.png 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/Photo-diodes-300x169.png 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/Photo-diodes-768x432.png 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/Photo-diodes.png 1280w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>The method involves placing the sample on a stage (platform) and measuring its shape using a needle or laser.<\/p>\n\n\n\n<p>The needle and sample repel each other by making each a + charge.<\/p>\n\n\n\n<p>The stage leaves the surface at the moment repulsive force is generated, allowing the surface to be measured without damaging the sample.<\/p>\n\n\n\n<p>By shining a laser onto a cantilever (a plate with a needle attached), the cantilever deforms, causing the laser&#8217;s reflection angle to change, which allows the shape to be measured.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">What can be observed with AFM (Atomic Force Microscopy)<\/h2>\n\n\n\n<p>AFM is a microscope capable of visualizing surface topography at the nanoscale. It enables not only the observation of surface structures but also the evaluation of a wide range of properties, including material hardness and electrical resistance.<\/p>\n\n\n\n<p>Here, we will examine in detail what kind of information can be obtained with AFM, broken down by specific measurement parameters.&nbsp;<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Surface structure of objects<\/h3>\n\n\n\n<p>AFM enables measurement of surface roughness on various materials, processed items, and molded objects.<\/p>\n\n\n\n<p>Evaluating surface roughness is a critical process directly linked not only to managing finish uniformity and appearance quality but also to improving product lifespan, friction characteristics, and mechanical efficiency.&nbsp;<\/p>\n\n\n\n<p>For example, it can be utilized for a wide range of evaluations, including the reflective properties of gloss finishes, the airtightness of packaging, the texture of embossed finishes, the friction force of clutches and valves, the adhesion of substrates and plating, the print quality of printed paper, and the performance of optical components.&nbsp;<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Material hardness<\/h3>\n\n\n\n<p>AFM measures mechanical properties such as elastic modulus and viscoelasticity, enabling detailed evaluation of a material&#8217;s \u201chardness\u201d and its response to applied force.&nbsp;<\/p>\n\n\n\n<p>Elastic modulus indicates a material&#8217;s \u201cresistance to deformation\u201d when subjected to external force; a higher value signifies a harder material that resists deformation.<\/p>\n\n\n\n<p>Conversely, viscoelasticity indicates a material&#8217;s \u201cstickiness\u201d and \u201ctendency to return to its original state,\u201d which is useful in analyzing shock absorption and energy transfer.<\/p>\n\n\n\n<p>Measuring these properties is valuable for material design where both strength and flexibility are required, such as in tires.<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Electrical resistance<\/h3>\n\n\n\n<p>AFM can measure not only surface structures but also current resistance values.<\/p>\n\n\n\n<p>Materials with higher resistance allow current to flow less easily, while materials with lower resistance allow current to flow more readily.<\/p>\n\n\n\n<p>In particular, materials with low resistance values exhibit high antistatic properties, making them more effective at preventing electrostatic discharge damage.<\/p>\n\n\n\n<p>Evaluating electrical resistance with AFM is a crucial technique applicable to a wide range of product designs, including quality control for electronic components and conductive materials, as well as the development of antistatic materials.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Real image samples from AFM (Atomic Force Microscopy).<\/h2>\n\n\n\n<p>AFM can also observe non-conductive materials and is used in various fields.<\/p>\n\n\n\n<p>The following sections will show you the images together with a picture.<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Observation of protein and myosin V movement<\/h3>\n\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<figure class=\"wp-block-image size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"329\" height=\"181\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/image-1.png\" alt=\"\" class=\"wp-image-5026\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/image-1.png 329w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/image-1-300x165.png 300w\" sizes=\"auto, (max-width: 329px) 100vw, 329px\" \/><\/figure>\n\n\n\n<p>source\uff1ahttps:\/\/www.ribm.co.jp\/equipment_d\/equipment\/afm\/sub_ssnex<\/p>\n<\/blockquote>\n\n\n\n<p>Util this observation was made, the movement of myosin V had been merely speculated upon.<\/p>\n\n\n\n<p>Video footage using a high-speed AFM showed myosin V \u2018walking\u2019.<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Observation of rotation and structural changes in F1-AT Pase<\/h3>\n\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<figure class=\"wp-block-image size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"263\" height=\"179\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/image-2.png\" alt=\"\" class=\"wp-image-5027\"\/><\/figure>\n\n\n\n<p>source\uff1ahttps:\/\/www.ribm.co.jp\/equipment_d\/equipment\/afm\/sub_ssnex<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n<\/blockquote>\n\n\n\n<h2 class=\"wp-block-heading\">Two measurement modes of AFM (Atomic Force Microscopy)<\/h2>\n\n\n\n<p>AFM measurement modes are broadly categorized into the following two types:<\/p>\n\n\n\n<p>\u30fbContact Mode<\/p>\n\n\n\n<p>\u30fbDynamic Mode<\/p>\n\n\n\n<p>Let&#8217;s examine them in detail in the next section.<\/p>\n\n\n\n<p><\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Contact Mode<\/h3>\n\n\n\n<p>Contact mode is used to evaluate the surface topography of relatively hard materials.&nbsp;<\/p>\n\n\n\n<p>In this method, the probe (cantilever tip) scans while maintaining constant contact with the sample surface. The resulting deflection is detected to measure the surface topography.<\/p>\n\n\n\n<p>While its principle is simple and it readily achieves high resolution, continuous contact between the probe and sample generates friction and it can potentially damage soft materials.<\/p>\n\n\n\n<div style=\"height:16px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h3 class=\"wp-block-heading\">Dynamic Mode<\/h3>\n\n\n\n<p>In Dynamic Mode, the cantilever is vibrated near its resonance frequency while measuring the sample surface.<\/p>\n\n\n\n<p>The height is automatically controlled to maintain a constant amplitude change caused by the probe interacting with the sample.&nbsp;<\/p>\n\n\n\n<p>Compared to contact mode, it causes less damage to the sample. Furthermore, using a stiffer cantilever offers the advantage of suppressing the effects of static electricity.<\/p>\n\n\n\n<p>Another characteristic is the ability to obtain information about viscoelasticity from the acquired phase signal.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">History of AFM (Atomic Force Microscopy)<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"698\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4-1024x698.jpg\" alt=\"\" class=\"wp-image-5028\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4-1024x698.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4-300x204.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4-768x523.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4-1536x1046.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/picpic4.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>Originally, the \u2018STM: Scanning Tunneling Microscope\u2019 was developed to observe on the sample surface.<\/p>\n\n\n\n<p>However, STM has the disadvantage that only conductive samples can be observed, as the surface is observed by detecting tunneling currents.<\/p>\n\n\n\n<p>Therefore, in 1986, Dr \u2018Gerd Beinig\u2019, Dr \u2018Calvin Quart\u2019 and others developed the AFM, which converts interatomic energy into electrical signals, and has been used to this day.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Summary<\/h2>\n\n\n\n<p>In this article, we explained AFM (Atomic Force Microscopy).<\/p>\n\n\n\n<p>Finally, let&#8217;s look back at the key points.<\/p>\n\n\n\n<p><\/p>\n\n\n\n<p>\u30fbAFM is a microscope that uses atomic forces to measure the unevenness of a sample surface by cantilever distortion and laser reflection.<\/p>\n\n\n\n<p>\u30fbNon-conductive materials that could not be realised by STM can be measure<\/p>\n\n\n\n<p>\u30fbPreviously only images were available, but with the birth of high-speed AFM, it is now possible to make movies.<\/p>\n\n\n\n<p>\u30fbAFM was developed in 1986.<\/p>\n\n\n\n<p>We mentioned at the beginning that AFM is a type of SPM (scanning probe microscope).<\/p>\n\n\n\n<p>For more information on SPM, see also the following article.<\/p>\n\n\n<div class=\"related_link\"><span class=\"title\"><i class=\"fa-solid fa-bookmark\"><\/i>Related articles.<\/span><ul><li><a href=\"https:\/\/agus.co.jp\/en\/?p=5038\"><span class=\"thumbnail\"><img decoding=\"async\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/pic1-3.jpg\"><\/span><span class=\"post_title\">What is a scanning probe microscope (SPM)? An explanation of types, uses in society and history<\/span><\/a><\/li><\/ul><\/div>\n","protected":false},"excerpt":{"rendered":"<p>Atomic force microscopy (AFM) is a type of scanning probe microscopy (SPM).[\u3082\u3063\u3068\u8aad\u307e\u305b\u3066\u301c]<\/p>\n","protected":false},"author":1,"featured_media":5020,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[44],"tags":[],"class_list":["post-5019","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-topics"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.2 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>What is AFM (Atomic Force Microscopy)? 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