{"id":5053,"date":"2026-02-10T08:21:35","date_gmt":"2026-02-09T23:21:35","guid":{"rendered":"https:\/\/agus.co.jp\/en\/?p=5053"},"modified":"2026-02-10T08:21:47","modified_gmt":"2026-02-09T23:21:47","slug":"what-is-stm-scanning-tunneling-microscope-a-simple-explanation-of-how-it-works-its-features-and-history","status":"publish","type":"post","link":"https:\/\/agus.co.jp\/en\/?p=5053","title":{"rendered":"What is STM (Scanning Tunneling Microscope)? A simple explanation of how it works, its features and history!"},"content":{"rendered":"\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"576\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4-1024x576.jpg\" alt=\"\" class=\"wp-image-5055\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4-1024x576.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4-300x169.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4-768x432.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4-1536x864.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic4-4.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>STM (scanning tunneling microscope) is a type of SPM (scanning probe microscope).<\/p>\n\n\n\n<p>If you would like to know more about SPM, please read the following article, which also explains it.<\/p>\n\n\n<div class=\"related_link\"><span class=\"title\"><i class=\"fa-solid fa-bookmark\"><\/i>Related articles.<\/span><ul><li><a href=\"https:\/\/agus.co.jp\/en\/?p=5038\"><span class=\"thumbnail\"><img decoding=\"async\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/pic1-3.jpg\"><\/span><span class=\"post_title\">What is a scanning probe microscope (SPM)? An explanation of types, uses in society and history<\/span><\/a><\/li><\/ul><\/div>\n\n\n\n<p>This article provides a simple explanation of how STMs observe samples.<\/p>\n\n\n\n<p>We hope that you will find this information useful, as we can only provide it because we are usually involved in work related to atoms.<\/p>\n\n\n\n<p>Let&#8217;s look at it.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">STM (scanning tunneling microscope) is a microscope that uses tunneling currents.<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"597\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3-1024x597.jpg\" alt=\"\" class=\"wp-image-5057\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3-1024x597.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3-300x175.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3-768x448.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3-1536x896.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic3-3.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p><\/p>\n\n\n\n<p>STM is a microscope that observes surface irregularities by detecting tunneling currents between a metal probe and a conductive sample.<\/p>\n\n\n\n<p>The multi-probe scanning tunneling microscopes, one of the STMs, use several needles and can characterize Nano scale samples.<\/p>\n\n\n\n<p>As well as measuring surfaces, it also has the feature of being able to process individual atoms, enabling sample surfaces to be processed at the nanometer level.<\/p>\n\n\n\n<p>The disadvantage is that, as it uses tunneling currents, materials that do not conduct current cannot be measured.<\/p>\n\n\n\n<p><a href=\"https:\/\/agus.co.jp\/en\/?p=5019\">AFM (Atomic Force Microscopy)<\/a>is used to measure conductive materials.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Structures of STM (Scanning Tunneling Microscope).<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"576\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/piezoelectric-element-1024x576.png\" alt=\"\" class=\"wp-image-5059\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/piezoelectric-element-1024x576.png 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/piezoelectric-element-300x169.png 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/piezoelectric-element-768x432.png 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/piezoelectric-element.png 1280w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>Piezoelectric elements are used in the cantilever to which the STM probe is attached.<\/p>\n\n\n\n<p>The system is based on a piezo element that is distorted by applying a voltage to it, and by adjusting the distance between the needle and the sample, the unevenness of the sample surface can be detected.<\/p>\n\n\n\n<p>The further away the sample and needle are, the weaker the tunneling current becomes, and the closer they are, the stronger the tunneling current becomes.<\/p>\n\n\n\n<p>The method is to measure the size of the surface by returning it to its initial position in relation to the strength of this current.<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Real image sample of STM (Scanning Tunneling Microscope).<\/h2>\n\n\n\n<p>A STM allows you to see atoms down to the size of a grain.<\/p>\n\n\n\n<p>Looking at the real image samples, you can see the connections between atoms and clearly see what is shown in the image diagrams in textbooks.<\/p>\n\n\n\n<p>For a sample of the actual image, please see the following pages.<\/p>\n\n\n\n<p><a href=\"https:\/\/hooktail.sub.jp\/solid\/STM\/\">Scanning Tunneling Microscope (STM)<\/a><\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">History of STM (scanning tunneling microscopy)<\/h2>\n\n\n\n<figure class=\"wp-block-image size-large\"><img loading=\"lazy\" decoding=\"async\" width=\"1024\" height=\"682\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1-1024x682.jpg\" alt=\"\" class=\"wp-image-5060\" srcset=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1-1024x682.jpg 1024w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1-300x200.jpg 300w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1-768x512.jpg 768w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1-1536x1023.jpg 1536w, https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/02\/pic1-4-1.jpg 1600w\" sizes=\"auto, (max-width: 1024px) 100vw, 1024px\" \/><\/figure>\n\n\n\n<p>The STM is the oldest microscope of its kind, the scanning probe microscope.<\/p>\n\n\n\n<p>Developed in 1981 by Dr \u2018Gerd Beinig\u2019 and Dr \u2018Heinrich Rohrer\u2019 at the IBM Zurich Research Institute.<\/p>\n\n\n\n<p>It was a revolutionary microscope that could not only measure surfaces but also process atoms, but it also had the disadvantage that it could not measure non-conductive materials.<\/p>\n\n\n\n<p>This shortcoming was the seed for the later development of the atomic force microscope (AFM).<\/p>\n\n\n\n<div style=\"height:24px\" aria-hidden=\"true\" class=\"wp-block-spacer\"><\/div>\n\n\n\n<h2 class=\"wp-block-heading\">Summary<\/h2>\n\n\n\n<p>In this article, we explained STM (Scanning Tunneling Microscopy).<\/p>\n\n\n\n<p>Finally, let&#8217;s look back at the key points.<\/p>\n\n\n\n<p>\u30fbSTM is a microscope that uses tunneling currents generated between a metal probe and a conductive material to measure the unevenness of a sample surface<\/p>\n\n\n\n<p>\u30fbOther probe scanning tunneling microscopes can also measure the characteristics<\/p>\n\n\n\n<p>\u30fbNot only can surfaces be measured, but also each atom can be processed<\/p>\n\n\n\n<p>\u30fbIt has the disadvantage that only conductive substances can be measured.<\/p>\n\n\n\n<p>\u30fbSTM was developed in 1981.<\/p>\n\n\n\n<p>We mentioned at the beginning that STM is a type of SPM (scanning probe microscope).<\/p>\n\n\n\n<p>If you would like to know more about SPM, please read the following article, which also explains it.<\/p>\n\n\n<div class=\"related_link\"><span class=\"title\"><i class=\"fa-solid fa-bookmark\"><\/i>Related articles.<\/span><ul><li><a href=\"https:\/\/agus.co.jp\/en\/?p=5038\"><span class=\"thumbnail\"><img decoding=\"async\" src=\"https:\/\/agus.co.jp\/en\/wp-content\/uploads\/2026\/01\/pic1-3.jpg\"><\/span><span class=\"post_title\">What is a scanning probe microscope (SPM)? An explanation of types, uses in society and history<\/span><\/a><\/li><\/ul><\/div>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>STM (scanning tunneling microscope) is a type of SPM (scanning probe micros[\u3082\u3063\u3068\u8aad\u307e\u305b\u3066\u301c]<\/p>\n","protected":false},"author":1,"featured_media":5055,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[58],"tags":[],"class_list":["post-5053","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-technology"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.2 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>What is STM (Scanning Tunneling Microscope)? 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